Efficient and adaptive nonparametric test for the two-sample problem
两样本问题的有效且自适应的非参数检验
The notion of efficient test for a Euclidean parameter in a semiparametric model was introduced by Stein [Proc. Third Berkeley Symp. Math. Statist. Probab. 1 (1956) 187-195]. Such tests are locally most powerful for a wide class of infinite-dimensional nuisance parameters. The first formal application of this notion to a suitably parametrized two-sample problem was provided by Hájek [Ann. Math. Statist. 33 (1962) 1124-1147]. However, this and subsequent solutions appear to…