On optimal inference in the linear IV model
线性工具变量模型中的最优推断AI 解读 ↓
本页整理公开书目信息,不生成学术质量评分。AI 解读根据题名及所注明的摘要或原文片段生成,未完成全文核验,可能有误;具体假设、证明与结论请核对原文。摘要保留来源文本,未经模型改写。
DOI 首次登记不等于接收或发表日期。部分更正、评论等条目没有独立摘要;缺少可靠材料时保留待补状态。
引用量采用 OpenAlex 单条关联记录,不合计多个记录;关联记录可能包含正式发表版本,不等于此版本单独引用。缺失不视为零,引用指标不代表论文质量。
关注作者按书目中的完整姓名匹配,同名和姓名变体需人工辨别。相关论文先按共享细分方向和具体方法排列,再参考通用方法与发表日期。
AI 根据所提供的论文材料归类:摘要聚焦一般线性 IV 模型中的检验功效和置信集最优性,没有足够文本依据归入所列具体应用领域。
线性工具变量模型中的最优推断AI 解读 ↓
正在核对关联版本…
正在核对对应版本的资源…
This paper considers tests and confidence sets (CSs) concerning the coefficient on the endogenous variable in the linear IV regression model with homoskedastic normal errors and one right‐hand side endogenous variable. The paper derives a finite‐sample lower bound function for the probability that a CS constructed using a two‐sided invariant similar test has infinite length and shows numerically that the conditional likelihood ratio (CLR) CS of Moreira (2003) is not always “very close,” say 0.005 or less, to this lower bound function. This implies that the CLR test is not always very close to the two‐sided asymptotically‐efficient (AE) power envelope for invariant similar tests of Andrews, Moreira, and Stock (2006) (AMS). On the other hand, the paper establishes the finite‐sample optimality of the CLR test when the correlation between the structural and reduced‐form errors, or between the two reduced‐form errors, goes to 1 or −1 and other parameters are held constant, where optimality means achievement of the two‐sided AE power envelope of AMS. These results cover the full range of (nonzero) IV strength. The paper investigates in detail scenarios in which the CLR test is not on the two‐sided AE power envelope of AMS. Also, theory and numerical results indicate that the CLR test is close to having the greatest average power, where the average is over a specified grid of concentration parameter values and over a pair of alternative hypothesis values of the parameter of interest, uniformly over all such pairs of alternative hypothesis values and uniformly over the correlation between the structural and reduced‐form errors. Here, “close” means 0.015 or less for k ≤ 20, where k denotes the number of IVs, and 0.025 or less for 0 < k ≤ 40. The paper concludes that, although the CLR test is not always very close to the two‐sided AE power envelope of AMS, CLR tests and CSs have very good overall properties.