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Two-Sample Tests Based on Cumulative Incidence Functions from Coherent Systems

Jayant V. Deshpande · Avinash D. Dharmadhikari · Uttara V. Naik-Nimbalkar刊期 1993-12 · 卷 80（4）Biometrika已编入正刊

基于相干系统累积发生函数的两样本检验AI 解读

Suppose that n1 and n2 independent copies of a coherent system composed of m components operate in two different environments. All copies are monitored until their failure. The data consist of the lifetimes of all the components which fail before the system and the time to failure of the system which also is the censoring time for the components not yet failed. In this paper we propose a class of tests based on the incidence functions of the component failures obtained from…

检验与推断
被引 0 次 ↗OpenAlex · 核验
AI 解读阅读原文 ↗BibTeX ↓

Two-sample tests based on cumulative incidence functions from coherent systems

JAYANT V. DESHPANDE · AVINASH D. DHARMADHIKARI · UTTARA V. NAIK-NIMBALKAR刊期 1993 · 卷 80（4）Biometrika已编入正刊

基于相干系统累积发生函数的两样本检验AI 解读

Suppose that n1 and n2 independent copies of a coherent system composed of m components operate in two different environments. All copies are monitored until their failure. The data consist of the lifetimes of all the components which fail before the system and the time to failure of the system which also is the censoring time for the components not yet failed. In this paper we propose a class of tests based on the incidence functions of the component failures obtained from…

检验与推断
被引 2 次 ↗OpenAlex · 核验
AI 解读阅读原文 ↗BibTeX ↓