Log-Linear Models for Doubly Sampled Categorical Data Fitted by the EM Algorithm
用 EM 算法拟合双重抽样分类数据的对数线性模型
Double-sampling experiments can be expressed as incomplete multiway contingency tables and analyzed by using techniques appropriate for fitting log-linear models. The framework described can be applied to experiments with any number of factors and measurement devices. Maximum likelihood estimation via the EM algorithm leads to straightforward expressions for covariances of estimates of the parameters and functions of the parameters.